Testing For Smalldelay Defects In Nanoscale Cmos Integrated Circuits

Name: Testing For Smalldelay Defects In Nanoscale Cmos Integrated Circuits
Author: Krishnendu Chakrabarty, Sandeep K. Goel

by Krishnendu Chakrabarty, Sandeep K. Goel

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Metal oxide semiconductors, complementaryNanotechnologyComplementary Metal oxide semiconductorsTestingMOS complémentairesEssaisTECHNOLOGY & ENGINEERINGMechanical