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Scan chain · Vinony

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EntityQ225990· pop 5· linked from 10 articles

Scan chain

type of manufacturing test used with integrated circuits

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via Wikidata sitelinks · CC0

Connections

Automatic test pattern generation

International Standard Book Number

Categories

Electronic circuit verification

Sources

wikipedia.externallinksexternallink

integrated circuit

Entity

system on a chip

application-specific integrated circuit

Serial Peripheral Interface

sequential logic

combinational logic

electronic design automation

controllability

integrated circuit design

Design for testing

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What links here10 pages

Automatic test pattern generation

Design for testing

High-temperature operating life

Serial Peripheral Interface

semiconductor device fabrication

Hardware Trojan

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