thumb|Electromigration (red arrow) is due to the momentum transfer from the electrons moving in a wire Electromigration is the transport of material caused by the gradual movement of the ions in a conductor due to the momentum transfer between conducting electrons and diffusing metal atoms. The effect is important in applications where high direct current densities are used, such as in microelectronics and related structures. As the structure size in electronics such as integrated circuits (ICs) decreases, the practical significance of this effect increases.
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Within Vinony's link graph, 电迁移 is referenced by 73 other articles, and connects out to integrated circuit, interconnects and electric current.
It is catalogued under topics including Electric and magnetic fields in matter, Electrochemistry and Electronic design automation.
Its subject is documented across 15 Wikipedia language editions.
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- Electromigration
- studied by
- microelectronics
- has cause
- electric current density
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Article · 中文
电迁移（英語：Electromigration）是由于通电导体内的电子运动，把它们的动能传递给导体的金属离子，使离子朝电场反方向运动而逐渐迁移，导致导体的原子扩散、损失的一种现象。由法国科学家约在100年前发现的。但到1966年出现積體電路后，才有更多人对它进行研究。
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